Title :
Co-design of power amplifier and narrowband filter using high-Q evanescent-mode cavity resonator as the output matching network
Author :
Chen, Kenle ; Liu, Xiaoguang ; Chappell, William J. ; Peroulis, Dimitrios
Abstract :
A unique GaN power amplifier (PA) with an integrated evanescent-mode resonator as its output matching network is presented in this paper. Instead of matching the output of the GaN transistor to 50 Ω and connecting it to a 50-Ω bandpass filter, the GaN is directly integrated with a one-pole filter thus eliminating the conventionally-employed output matching network after the GaN transistor. This leads to a reduced circuit complexity and higher efficiency. The one-pole filter implemented by a strongly-coupled evanescent-mode cavity resonator with an unloaded quality factor of 320 is experimentally presented as a proof-of-concept demonstration. This design yields a very narrowband PA response from 1.24-1.275 GHz (2.8%), which is comparable to the bandwidth of typical communication signals. The PA exhibits a state-of-the-art performance of >; 70% efficiency, >; 10 dB gain, >; 30 dBm output power, and second and third harmonic levels of <; -70 dBc. The presented methodology has the potential to be further extended to a tunable design for multi-band applications.
Keywords :
III-V semiconductors; Q-factor; UHF power amplifiers; band-pass filters; cavity resonators; circuit complexity; gallium compounds; transistors; GaN; bandpass filter; circuit complexity; frequency 1.24 GHz to 1.275 GHz; high-Q evanescent-mode cavity resonator; integrated evanescent-mode resonator; matching network; multiband applications; narrowband PA response; narrowband filter; one-pole filter; power amplifier; quality factor; strongly-coupled evanescent-mode cavity resonator; transistor; Cavity resonators; Gallium nitride; Impedance; Impedance matching; Power harmonic filters; Resonant frequency; Transistors; Power amplifier; evanescent-mode cavity; high efficiency; narrowband filter;
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2011.5972854