DocumentCode :
2586137
Title :
An enriched cohesive zone model for numerical simulation of interfacial delamination in microsystems
Author :
Samimi, M. ; van Hal, B.A.E. ; Peerlings, R.H.J. ; van Dommelen, J.A.W. ; Geers, M.G.D.
Author_Institution :
Dept. of Mech. Eng., Eindhoven Univ. of Technol., Eindhoven
fYear :
2007
fDate :
16-18 April 2007
Firstpage :
1
Lastpage :
7
Abstract :
Interfacial failure, mainly in the form of debonding or delamination of brittle interfaces, is one of the major sources of failure in microsystems that consist of multiple thin and stacked layers, manufactured using different materials. A cohesive zone model with a simple traction- separation law is employed to simulate the benchmark test of pure mode I delamination in a double cantilever beam. A local arc-length control procedure is also detailed and its robustness is shown in the case that the quasi-static solution contains limit points due to the brittle nature of the interface considered here. Finally, a bilinear hierarchical extension is proposed to enhance the efficiency and robustness of cohesive zone models by enriching the separation approximation in the process zone of a cohesive crack in brittle interfaces without need for further mesh refinement.
Keywords :
beams (structures); brittleness; cantilevers; cracks; delamination; micromechanical devices; numerical analysis; brittle interfaces; cohesive crack; cohesive zone model; debonding; double cantilever beam; interfacial delamination; mesh refinement; microsystems; numerical simulation; pure mode I delamination; robustness; stacked layers; thin layers; Adhesives; Delamination; Force control; Integrated circuit packaging; Manufacturing; Materials science and technology; Numerical models; Numerical simulation; Piecewise linear approximation; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
Conference_Location :
London
Print_ISBN :
1-4244-1105-X
Electronic_ISBN :
1-4244-1106-8
Type :
conf
DOI :
10.1109/ESIME.2007.360024
Filename :
4201191
Link To Document :
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