Title :
Analog and digital circuit design in 65 nm CMOS: end of the road?
Author :
Gielen, G. ; Dehaene, Wim
Author_Institution :
Katholieke Universiteit Leuven, Belgium
Abstract :
This introductory embedded tutorial gives an overview of the design problems at hand when designing integrated electronic systems in nanometer-scale CMOS technologies. First, some general problems that affect circuit design are addressed, such as the increased leakage and variability with scaling technologies. Next, the impact of this on digital circuit design and embedded memories is discussed. Finally, problems bothering embedded analog circuits are presented, such as reducing supply voltages, poor design productivity and signal integrity troubles. Addressing these problems will determine whether the design road ends at CMOS technology marker "65 nm " or not.
Keywords :
CMOS integrated circuits; integrated circuit design; leakage currents; mixed analogue-digital integrated circuits; 65 nm; CMOS; analog circuit design; design productivity; digital circuit design; embedded memories; leakage currents; mixed-signal designs; process variability; signal integrity; supply voltage reduction; Analog circuits; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS technology; Circuit synthesis; Digital circuits; Integrated circuit technology; Roads; Signal design; Voltage;
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Print_ISBN :
0-7695-2288-2
DOI :
10.1109/DATE.2005.64