DocumentCode
2586273
Title
Analog and digital circuit design in 65 nm CMOS: end of the road?
Author
Gielen, G. ; Dehaene, Wim
Author_Institution
Katholieke Universiteit Leuven, Belgium
fYear
2005
fDate
7-11 March 2005
Firstpage
37
Abstract
This introductory embedded tutorial gives an overview of the design problems at hand when designing integrated electronic systems in nanometer-scale CMOS technologies. First, some general problems that affect circuit design are addressed, such as the increased leakage and variability with scaling technologies. Next, the impact of this on digital circuit design and embedded memories is discussed. Finally, problems bothering embedded analog circuits are presented, such as reducing supply voltages, poor design productivity and signal integrity troubles. Addressing these problems will determine whether the design road ends at CMOS technology marker "65 nm " or not.
Keywords
CMOS integrated circuits; integrated circuit design; leakage currents; mixed analogue-digital integrated circuits; 65 nm; CMOS; analog circuit design; design productivity; digital circuit design; embedded memories; leakage currents; mixed-signal designs; process variability; signal integrity; supply voltage reduction; Analog circuits; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS technology; Circuit synthesis; Digital circuits; Integrated circuit technology; Roads; Signal design; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2005. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2288-2
Type
conf
DOI
10.1109/DATE.2005.64
Filename
1395526
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