DocumentCode :
2586277
Title :
Efficient electrostatic-mechanical modeling of C-V curves of RF-MEMS switches
Author :
Bielen, Jeroen ; Stulemeijer, Jiri
Author_Institution :
NXP Semicond., Nijmegen
fYear :
2007
fDate :
16-18 April 2007
Firstpage :
1
Lastpage :
6
Abstract :
The capacitance versus actuation voltage, the C-V curve, is characteristic for the steady state behavior of a RF-MEMS capacitive switch. It is imperative to have an efficient method to simulate these curves and overcome the convergence problems from pull-in and release instability that is inherent to these electrostatic actuated devices. In this paper we show how the complete CV curve can be calculated in FE code, including conditionally stable parts and zipping regions, which also comprises a non-linear contact model. Efficiency improvement by use of a reduced order model for the electrostatic domain is shown. Validity of the simulation results is shown by comparison to measurements.
Keywords :
capacitance; electrical contacts; electromechanical effects; electrostatic actuators; finite element analysis; microswitches; reduced order systems; C-V curve; FE code; RF-MEMS switch; actuation voltage; capacitance; capacitive switch; electrostatic actuated device; electrostatic-mechanical modeling; nonlinear contact model; pull-in instability; reduced order model; release instability; steady state property; zipping region; Capacitance; Capacitance-voltage characteristics; Convergence; Electrostatics; Iron; Radiofrequency microelectromechanical systems; Reduced order systems; Steady-state; Switches; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
Conference_Location :
London
Print_ISBN :
1-4244-1105-X
Electronic_ISBN :
1-4244-1106-8
Type :
conf
DOI :
10.1109/ESIME.2007.360032
Filename :
4201199
Link To Document :
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