DocumentCode
25867
Title
Efficiency Improvement of Blue LEDs Using a GaN Burried Air Void Photonic Crystal With High Air Filling Fraction
Author
Jia-Zhe Liu ; Charlton, M.D.B. ; Chung-Hsiang Lin ; Kang-Yuan Lee ; Krishnan, Chandarasekaran ; Meng-Chyi Wu
Author_Institution
Inst. of Electron. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume
50
Issue
5
fYear
2014
fDate
May-14
Firstpage
314
Lastpage
320
Abstract
In this paper, we investigate the efficiency enhancement of blue InGaN/GaN light-emitting diodes (LEDs) by incorporating a burried air void photonic crystal (BAVPC) layer within the epitaxial structure. As compared with the conventional patterned sapphire substrate (C-PSS) LEDs and flat sapphire substrate LEDs with BAVPC, the fabricated patterned sapphire substrate (PSS) LEDs with BAVPC exhibit the lowest full-width at half-maximum of (002) and (102) diffraction peaks, the highest light output power of 20.6 mW, and the highest external quantum efficiency of 37.4%. Remarkable performance improvement in the PSS LED with BAVPC is attributed to the better epitaxial quality with threading dislocations terminated by the BAVPC and the higher scattering at interface between GaN and air-void. By positioning the BAVPC directly below the multiple quantum wells (MQWs), it would cause the reduction in the number of trapped optical modes. The methodology optically isolates the MQWs from the underlying substrate and increases the optical output power. Moreover, threading dislocations are significantly suppressed using the BAVPC with high air filling fraction of ~ 50%. It is well proposed that this methodology provides a promising alternative to C-PSS LEDs.
Keywords
III-V semiconductors; dislocations; gallium compounds; indium compounds; integrated optics; integrated optoelectronics; light emitting diodes; photonic crystals; sapphire; semiconductor quantum wells; wide band gap semiconductors; Al2O3; BAVPC; InGaN-GaN; MQW; blue LED; burried air void photonic crystal; conventional patterned sapphire substrate; efficiency 37.4 percent; efficiency enhancement; epitaxial quality; epitaxial structure; external quantum efficiency; flat sapphire substrate LED; high air filling fraction; light emitting diodes; light output power; multiple quantum wells; optical output power; patterned sapphire substrate LED; power 20.6 mW; threading dislocations; trapped optical modes; Epitaxial growth; Frequency selective surfaces; Gallium nitride; Light emitting diodes; Photonic crystals; Power generation; Substrates; Light-emitting diode (LED); burried air void photonic crystal (BAVPC); nanoimprint lithography (NIL); patterned sapphire substrate (PSS);
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2014.2309137
Filename
6762870
Link To Document