• DocumentCode
    2586739
  • Title

    Experimental Determination of Time-Independent Elastic-Plastic Behaviour of Solder Joints at High Strain Rates

  • Author

    Wiese, S. ; Meier, K. ; Scholz, D. ; Muller, A. ; Röllig, M. ; Rzepka, S. ; Wolter, K.-J.

  • Author_Institution
    Electron. Packaging Lab., Dresden Univ. of Technol., Dresden
  • fYear
    2007
  • fDate
    16-18 April 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In order to investigate the time-independent behaviour of solder joints at high strain rates, a test setup was created capable of measuring the force vs. time reaction of small solder joint in shear loading at strain rates between 10 -1 - 104 [1/s]. The paper describes the design of this high strain rate tester. Details providing for the fast and high resolution force measurement are given. The results of analytic and FEM analyses applied to optimize the force sensor are presented. The paper also points out the challenges of high strain rate measurements of small solder joints. The validation tests applied alumina chips with five SnAgCu solder joints, which had barrel shape with about 200 mum diameter and stand-off height. The test results show good reproducibility of the force vs. time reactions. They match the benchmark results obtained at moderate shear speeds with existing equipment. In addition, fractographic analysis clearly found the two failure modes, bulk and brittle, that had been expected. Hence, the new test setup seems well suited for the tasks it has been designed for.
  • Keywords
    alumina; benchmark testing; brittle fracture; brittleness; copper alloys; elasticity; electronics packaging; finite element analysis; force sensors; fractography; plasticity; shear deformation; silver alloys; solders; stress-strain relations; tin alloys; Al2O3; SnAgCu; alumina chips; benchmark tests; brittle mode; bulk mode; deformation; failure modes; finite element method; force sensor; fractographic analysis; shear loading; solder joints; strain rate measurements; Benchmark testing; Capacitive sensors; Failure analysis; Force measurement; Force sensors; Reproducibility of results; Semiconductor device measurement; Shape; Soldering; Strain measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
  • Conference_Location
    London
  • Print_ISBN
    1-4244-1105-X
  • Electronic_ISBN
    1-4244-1106-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2007.360052
  • Filename
    4201219