DocumentCode
2586739
Title
Experimental Determination of Time-Independent Elastic-Plastic Behaviour of Solder Joints at High Strain Rates
Author
Wiese, S. ; Meier, K. ; Scholz, D. ; Muller, A. ; Röllig, M. ; Rzepka, S. ; Wolter, K.-J.
Author_Institution
Electron. Packaging Lab., Dresden Univ. of Technol., Dresden
fYear
2007
fDate
16-18 April 2007
Firstpage
1
Lastpage
5
Abstract
In order to investigate the time-independent behaviour of solder joints at high strain rates, a test setup was created capable of measuring the force vs. time reaction of small solder joint in shear loading at strain rates between 10 -1 - 104 [1/s]. The paper describes the design of this high strain rate tester. Details providing for the fast and high resolution force measurement are given. The results of analytic and FEM analyses applied to optimize the force sensor are presented. The paper also points out the challenges of high strain rate measurements of small solder joints. The validation tests applied alumina chips with five SnAgCu solder joints, which had barrel shape with about 200 mum diameter and stand-off height. The test results show good reproducibility of the force vs. time reactions. They match the benchmark results obtained at moderate shear speeds with existing equipment. In addition, fractographic analysis clearly found the two failure modes, bulk and brittle, that had been expected. Hence, the new test setup seems well suited for the tasks it has been designed for.
Keywords
alumina; benchmark testing; brittle fracture; brittleness; copper alloys; elasticity; electronics packaging; finite element analysis; force sensors; fractography; plasticity; shear deformation; silver alloys; solders; stress-strain relations; tin alloys; Al2O3; SnAgCu; alumina chips; benchmark tests; brittle mode; bulk mode; deformation; failure modes; finite element method; force sensor; fractographic analysis; shear loading; solder joints; strain rate measurements; Benchmark testing; Capacitive sensors; Failure analysis; Force measurement; Force sensors; Reproducibility of results; Semiconductor device measurement; Shape; Soldering; Strain measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
Conference_Location
London
Print_ISBN
1-4244-1105-X
Electronic_ISBN
1-4244-1106-8
Type
conf
DOI
10.1109/ESIME.2007.360052
Filename
4201219
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