• DocumentCode
    2586750
  • Title

    Non-periodic perturbations in periodic RF structures

  • Author

    Jabotinski, Vadim ; Chernin, David ; Antonsen, Thomas M., Jr. ; Levush, Baruch

  • Author_Institution
    Beam-Wave Res., Bethesda, MD, USA
  • fYear
    2011
  • fDate
    5-10 June 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents analysis of the effects of non-periodic perturbations in periodic RF structures with the use of 3D finite element computer simulations. Small departures from periodicity change the phase shift experienced by a wave as it traverses an imperfect cell. Cell imperfections may be introduced intentionally or due to fabrication errors or material properties variations. The accumulated effects produce distortions of the fields. If the errors are large enough the structure modes become localized. We believe that this is the first demonstration of localization in a periodic RF structure in which the transverse and period dimensions are on the order of a wavelength. The phenomenon is similar to Anderson localization but has its own unique mechanisms. These results are demonstrated in a periodic structure being designed for a 670 GHz extended interaction klystron. In an ancillary result we document a limitation of finite element codes when applied to long periodic structures.
  • Keywords
    finite element analysis; klystrons; submillimetre wave propagation; 3D finite element computer simulations; Anderson localization; cell imperfection; extended interaction klystron; fabrication error; finite element code; frequency 670 GHz; imperfect cell traverse; material properties variation; nonperiodic perturbation effect analysis; period dimension; periodic RF structure; phase shift; wavelength order; Cavity resonators; Fabrication; Finite element methods; Layout; Periodic structures; Radio frequency; Three dimensional displays; Anderson localization; periodic structure; phase errors; spatial harmonics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
  • Conference_Location
    Baltimore, MD
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-61284-754-2
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2011.5972896
  • Filename
    5972896