DocumentCode :
2586842
Title :
Dynamic and static responses of a piezoelectric actuator at nanometer scale elongations
Author :
Bonnail, N. ; Tonneau, D. ; Capolino, J.A. ; Dallaporta, H.
Author_Institution :
Dept. de Phys., Faculte des Sci. de Luminy, Marseille, France
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
293
Abstract :
The need of linear displacements in the nanometer range leads to the use of piezoelectric actuators in nanotechnology equipment. The aim of this paper is to present a new procedure to characterize a piezoelectric actuator at low excitation level corresponding to elongation at nanometer scale, in a scanning tunneling microscope. It is shown that the actuator dilatation is estimated using the tunnel current between a sharp tip fixed to the actuator and a metallic surface as a displacement sensor, and computing indirectly the unknown elongation from the physical constants of the metal under test in a theoretical law. Then, the actuator output elongation to input voltage signals is measured, via the tunnel current, to evaluate static and dynamic responses of the actuator. The proposed procedure will be used to obtain the input-output actuator model in order to implement its control
Keywords :
dynamic response; elongation; nanotechnology; piezoelectric actuators; scanning electron microscopes; actuator dilatation estimation; actuator output elongation; displacement sensor; dynamic response; input voltage signals; input-output actuator model; linear displacements; low excitation level; metallic surface; nanometer scale elongations; nanotechnology equipment; piezoelectric actuator; scanning tunneling microscope; sharp tip; static response; tunnel current; Atomic force microscopy; Atomic measurements; Electrical equipment industry; Nanotechnology; Piezoelectric actuators; Scanning probe microscopy; Surface topography; Testing; Tunneling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
Conference_Location :
Rome
ISSN :
0197-2618
Print_ISBN :
0-7803-6401-5
Type :
conf
DOI :
10.1109/IAS.2000.881126
Filename :
881126
Link To Document :
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