• DocumentCode
    2586927
  • Title

    A very low phase-noise voltage-controlled-oscillator at X-band

  • Author

    Nick, Morteza ; Mortazawi, Amir

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2011
  • fDate
    5-10 June 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    An X-band VCO is designed by employing a compact tunable high-Q negative-resistance resonator. The implemented active resonator not only provides a high degree of frequency-selectivity, but also initiates and sustains the oscillations. The loaded-quality-factor of the resonator is 510. As a result, a simple and compact VCO has been designed by eliminating the need for the parallel feedback amplifier and external load coupling network. Therefore, size and DC power consumption are significantly reduced without degrading the phase-noise performance. The fabricated VCO operates at 8.2 GHz with 105 MHz tuning range. It shows a measured phase-noise of -149.5 dBc/Hz at 1 MHz frequency offset, and achieves a figure-of-merit (FOM) value of -211.7 dBc/Hz. To the best of author´s knowledge, the VCO presented in this paper achieves the lowest phase-noise and FOM compared to other planar oscillators reported to date.
  • Keywords
    Q-factor; cavity resonators; feedback amplifiers; microwave amplifiers; microwave oscillators; voltage-controlled oscillators; DC power consumption; X-band VCO; active resonator; external load coupling network; figure-of-merit; frequency 8.2 GHz; frequency selectivity; loaded-quality-factor; low phase-noise voltage-controlled-oscillator; parallel feedback amplifier; planar oscillators; tunable high-Q negative-resistance resonator; Matched filters; Microstrip; Phase measurement; Power measurement; Reflection; Resonant frequency; Resonator filters; Active resonator; dual-mode resonator; elliptic filter; oscillator; phase noise; quality factor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
  • Conference_Location
    Baltimore, MD
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-61284-754-2
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2011.5972905
  • Filename
    5972905