Block-Diagram Based SIMULINK Analysis for the Drop Impact Response of a Mobile Electronic System

Author

Zhou, Jiang ; Corder, Paul ; Niraula, Ratna P.

Author_Institution

Dept. of Mech. Eng., Lamar Univ., Beaumont, TX

fYear

2007

fDate

16-18 April 2007

Firstpage

1

Lastpage

7

Abstract

In this paper, the block diagram based SIMULINK models were developed to evaluate the dynamic response of a portable electronic product with various impact configurations. The visual interfaces of the developed models present results in a way that people can immediately identify the effects of changing system parameters. It was found that time durations of the input profiles play an important role in the dynamic response. The system response can be designed by carefully choosing the impact time. Certain input pulse time results in the response with very low ringing after first or second peaks.

Keywords

digital simulation; dynamic response; electronic engineering computing; electronic equipment manufacture; impact testing; mobile handsets; semiconductor device testing; block-diagram based SIMULINK analysis; drop impact response; drop testing; dynamic response; input pulse time; mobile electronic system; mobile phone; portable electronic products design; visual interfaces; Analytical models; Damping; Mathematical model; Mechanical engineering; Mobile handsets; Packaging; Predictive models; Springs; Testing; Vibrations;

fLanguage

English

Publisher

ieee

Conference_Titel

Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on

Conference_Location

London

Print_ISBN

1-4244-1105-X

Electronic_ISBN

1-4244-1106-8

Type

conf

DOI

10.1109/ESIME.2007.360063

Filename

4201230