DocumentCode :
2586970
Title :
Block-Diagram Based SIMULINK Analysis for the Drop Impact Response of a Mobile Electronic System
Author :
Zhou, Jiang ; Corder, Paul ; Niraula, Ratna P.
Author_Institution :
Dept. of Mech. Eng., Lamar Univ., Beaumont, TX
fYear :
2007
fDate :
16-18 April 2007
Firstpage :
1
Lastpage :
7
Abstract :
In this paper, the block diagram based SIMULINK models were developed to evaluate the dynamic response of a portable electronic product with various impact configurations. The visual interfaces of the developed models present results in a way that people can immediately identify the effects of changing system parameters. It was found that time durations of the input profiles play an important role in the dynamic response. The system response can be designed by carefully choosing the impact time. Certain input pulse time results in the response with very low ringing after first or second peaks.
Keywords :
digital simulation; dynamic response; electronic engineering computing; electronic equipment manufacture; impact testing; mobile handsets; semiconductor device testing; block-diagram based SIMULINK analysis; drop impact response; drop testing; dynamic response; input pulse time; mobile electronic system; mobile phone; portable electronic products design; visual interfaces; Analytical models; Damping; Mathematical model; Mechanical engineering; Mobile handsets; Packaging; Predictive models; Springs; Testing; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
Conference_Location :
London
Print_ISBN :
1-4244-1105-X
Electronic_ISBN :
1-4244-1106-8
Type :
conf
DOI :
10.1109/ESIME.2007.360063
Filename :
4201230
Link To Document :
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