Title :
Global Digital-Analog Co-Simulation Methodology for Power and Signal Integrity aware Design and Analysis
Author :
Wane, Sidina ; Boguszewski, Guillaume
Author_Institution :
NXP-Semicond., Caen
Abstract :
In this paper a global co-simulation methodology for concurrent/simultaneous analysis of passive and active analog/digital parts is proposed. An original power-signature concept is introduced to model high-speed digital modules temporal and spatial distribution of their power switching activity through specified chip partitions. Dedicated real-world NXP-Philips-Semiconductors active modules mounted on test-board have been designed and measured for validation of the proposed co-simulation methodology. Full-wave electromagnetic modeling, broadband SPICE compact model extractions and measurement results are successfully compared.
Keywords :
mixed analogue-digital integrated circuits; power integrated circuits; NXP-Philips-Semiconductors active modules; broadband SPICE compact model; full-wave electromagnetic modeling; global digital-analog co-simulation; high-speed digital modules; power switching activity; power-signature concept; signal integrity aware design; Analytical models; Coupling circuits; Digital-analog conversion; Electromagnetic analysis; Electromagnetic measurements; Electromagnetic modeling; Frequency domain analysis; Semiconductor device measurement; Signal analysis; Signal design;
Conference_Titel :
Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European
Conference_Location :
Amsterdam
Print_ISBN :
978-2-87487-007-1
DOI :
10.1109/EMICC.2008.4772326