DocumentCode
2587083
Title
Sixth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium. SEMI-THERM Proceedings 1990 (Cat. No.90CH2640-1)
fYear
1990
fDate
6-8 Feb. 1990
Abstract
The following topics are dealt with: thermal measurement and characterization; thermal management; and thermal simulation, computation, and analysis. Abstracts of individual papers can be found under the relevant classification codes in this or other issues
Keywords
cooling; packaging; semiconductor technology; temperature measurement; thermal resistance; computation; semiconductor technology; temperature measurement; thermal analysis; thermal characterisation; thermal measurement; thermal simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal and Temperature Measurement Symposium, 1990. SEMI-THERM VI, Proceedings., Sixth Annual IEEE
Conference_Location
Phoenix, AZ, USA
Type
conf
DOI
10.1109/STHERM.1990.68505
Filename
68505
Link To Document