DocumentCode :
2587658
Title :
Preparation of ceramic thin films by electrospray of ceramic suspensions
Author :
Miao, P. ; Balachandran, W. ; Xiao, P.
Author_Institution :
Dept. of Syst. Eng., Brunel Univ., Uxbridge, UK
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
569
Abstract :
An electrostatic atomization technique has been developed to generate ultra-fine spray of ZrO2 and SiC ceramic suspensions in a range of a few micrometers with a narrow size distribution. The aim of this work is to generate fine spray of ceramic suspensions for preparation of uniform thin films of these ceramic materials on substrates. Compared to some other thin film deposition techniques, such as chemical vapour deposition (CVD), physical vapour deposition (PVD) and plasma spray (PS) etc. the thin film deposition process using electrostatic atomization is not only cheap but also controllable. Preliminary results have shown that for low throughput atomization, the cone-jet is the most suitable method to produce a fine charged aerosol with a narrow size distribution, which is crucial to produce uniform thin films. It was found that the droplet size of the spray is in the range of a few micrometers with a narrow size distribution and that droplet size and spray current obey theoretical prediction of scaling law. The prepared ZrO2 and SiC thin films were observed to be homogenous with a particle size less than 10 μm
Keywords :
aerosols; ceramics; silicon compounds; spray coating techniques; sprays; thin films; zirconium compounds; SiC; SiC ceramic suspension; ZrO2; ZrO2 ceramic suspension; ceramic suspensions; ceramic thin films preparation; cone-jet; droplet size; electrospray; electrostatic atomization; fine charged aerosol; fine spray; narrow size distribution; substrates; Atomic layer deposition; Ceramics; Chemical vapor deposition; Electrostatics; Silicon carbide; Sputtering; Substrates; Suspensions; Thermal spraying; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
Conference_Location :
Rome
ISSN :
0197-2618
Print_ISBN :
0-7803-6401-5
Type :
conf
DOI :
10.1109/IAS.2000.881167
Filename :
881167
Link To Document :
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