• DocumentCode
    2587682
  • Title

    Automated checking for Windows host vulnerabilities

  • Author

    Tamizi, Matin ; Weinstein, Matt ; Cukier, Michel

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Maryland Univ., College Park, MD
  • fYear
    2005
  • fDate
    1-1 Nov. 2005
  • Lastpage
    148
  • Abstract
    Evaluation of computing system security requires knowledge of the vulnerabilities present in the system and of potential attacks against the system. Vulnerabilities can be classified based on their location as application vulnerabilities, network vulnerabilities, or host vulnerabilities. This paper describes Ferret-Windows, a new software tool for checking host vulnerabilities on the Windows platforms. This tool helps system administrators by quickly finding vulnerabilities that are present on a host. It is designed and implemented in a modular way: a plug-in module is used for each vulnerability checked, and each possible output format is specified by a plug-in module. Moreover, several vulnerability fixing plug-in modules exist to help users remove specific vulnerabilities. As a result, Ferret-Windows is extensible, and can easily be kept up-to-date through the addition of checks for new vulnerabilities as they are identified. Finally, Ferret-Windows is a freely available open-source software
  • Keywords
    operating systems (computers); program diagnostics; security of data; software reliability; software tools; Ferret-Windows software tool; Windows host vulnerability checking; Windows platforms; application vulnerabilities; computing system security; host vulnerabilities; network vulnerabilities; open-source software; plug-in module; system attacks; Application software; Computer network reliability; Computer networks; Computer security; Educational institutions; Inspection; Mechanical engineering; Open source software; Retina; Software tools;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 2005. ISSRE 2005. 16th IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1071-9458
  • Print_ISBN
    0-7695-2482-6
  • Type

    conf

  • DOI
    10.1109/ISSRE.2005.11
  • Filename
    1544729