Title :
Evaluation of a solid state opening switch (SOS) diode pulser for use in a electrochemical reactor
Author :
Giesselmann, M. ; Kristiansen, M. ; Grinstead, B. ; Wilson, M.
Author_Institution :
Dept. of Electr. Eng., Texas Tech. Univ., Lubbock, TX, USA
Abstract :
A pulse generator, constructed by a group of Russian scientists, which uses a solid state opening switch (SOS), was characterized and tested. The diode acts similar to a step recovery diode but has voltage and current ratings that exceed the levels in US manufactured step-recovery diodes by orders of magnitude. To the authors´ knowledge, there are no US manufactured diodes for the application described here. With the load chosen for this paper, the generator produces pulses of 100 kV amplitude and 10 ns half width, using a 600 V DC supply. The maximum pulse repetition rate is 100 Hz, limited by thermal considerations of the primary charging resistor. This limit could be easily overcome by using a switch-mode power supply to charge the primary capacitors. This pulser can be used to generate partial discharges in a chemical reactor in order to produce ozone for a variety of industrial uses such as sterilization, oxidation, NOx or SOx removal from exhaust gases, etc. The greatest advantage is the long lifetime of this all solid-state device
Keywords :
chemical reactions; ozone; partial discharges; power semiconductor diodes; power semiconductor switches; pulsed power supplies; pulsed power switches; switched mode power supplies; 10 ns; 100 Hz; 100 kV; 600 V; NOx removal; SOx removal; current ratings; diode pulser; electrochemical reactor; exhaust gases; maximum pulse repetition rate; oxidation; ozone production; partial discharges generation; primary capacitors charging; primary charging resistor; solid state opening switch; sterilization; switch-mode power supply; thermal considerations; voltage ratings; DC generators; Diodes; Manufacturing; Pulse generation; Pulsed power supplies; Solid state circuits; Space vector pulse width modulation; Switches; Testing; Voltage;
Conference_Titel :
Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
Conference_Location :
Rome
Print_ISBN :
0-7803-6401-5
DOI :
10.1109/IAS.2000.881170