• DocumentCode
    2587761
  • Title

    High-voltage pulse stress on biomedical ultrasound probe soldered with Ag-ECA

  • Author

    Catelani, Marcantonio ; Scarano, Valeria L. ; Bertocci, Francesco ; Singuaroli, Roberto

  • Author_Institution
    Dept. of Electron. & Telecommun., Univ. of Florence, Firenze, Italy
  • fYear
    2010
  • fDate
    April 30 2010-May 1 2010
  • Firstpage
    81
  • Lastpage
    85
  • Abstract
    In this paper the results from a study of high-voltage pulse stressing effects on ultrasound array transducers are presented. The ultrasound transducers have been implemented with a new Pb-free soldering technology, using Silver Electrically Conductive Adhesive. The conductive adhesive have been used among the platelet of piezoelectric and fingers of connection for the implementation of phased array transducer. In order to evaluate the reliability of the biomedical instrument electrical tests are proposed. Some experimental results through a measurement system for the electro-acoustic characterization of the medical probe before and after stress test are obtained and analyzed.
  • Keywords
    adhesives; bioelectric phenomena; biomedical materials; biomedical ultrasonics; silver; Pb-free soldering technology; biomedical instrument electrical tests; biomedical ultrasound probe; electro-acoustic characterization; high-voltage pulse stress; high-voltage pulse stressing effects; medical probe; phased array transducer; piezoelectric platelet; silver electrically conductive adhesive; soldering; ultrasound array transducers; Biomedical measurements; Biomedical transducers; Conductive adhesives; Phased arrays; Piezoelectric transducers; Probes; Stress; Ultrasonic imaging; Ultrasonic transducer arrays; Ultrasonic transducers; Ag-ECA; electrical stress test; high-voltage pulse; phased array probe; silver electrically conductive adhesive; ultrasound piezoelectric transducer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Medical Measurements and Applications Proceedings (MeMeA), 2010 IEEE International Workshop on
  • Conference_Location
    Ottawa, ON
  • Print_ISBN
    978-1-4244-6288-9
  • Type

    conf

  • DOI
    10.1109/MEMEA.2010.5480214
  • Filename
    5480214