• DocumentCode
    2587822
  • Title

    An initial study of a lightweight process for change identification and regression test selection when source code is not available

  • Author

    Zheng, Jiang ; Robinson, Brian ; Williams, Laurie ; Smiley, Karen

  • Author_Institution
    Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC
  • fYear
    2005
  • fDate
    1-1 Nov. 2005
  • Lastpage
    234
  • Abstract
    Various regression test selection techniques have been developed and have shown to improve testing cost effectiveness via improving efficiency. The majority of these test selection techniques rely on access to source code for change identification. However, when new releases of COTS components are made available for integration and testing, source code is often not available to guide in regression test selection. In this paper we describe a lightweight integrated-black-box approach for component change identification (I-BACCI) process for selection of regression tests for user/glue code that uses COTS components. I-BACCI is applicable when component licensing agreements do not preclude binary code analysis. A case study of the process was conducted on an ABB product that uses a medium-scale internal ABB software component. Six releases of the component were examined to evaluate the efficacy of the proposed process. The result of the case study indicates that this process can reduce the required regression tests by 40% on average
  • Keywords
    object-oriented programming; program diagnostics; program testing; regression analysis; COTS components; binary code analysis; component change identification; component licensing agreement; glue code; lightweight integrated-black-box approach; program testing; regression test selection; Application software; Binary codes; Computer science; Costs; Hardware; Large-scale systems; Licenses; Software libraries; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 2005. ISSRE 2005. 16th IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1071-9458
  • Print_ISBN
    0-7695-2482-6
  • Type

    conf

  • DOI
    10.1109/ISSRE.2005.8
  • Filename
    1544737