DocumentCode
2588020
Title
Defect aware test patterns
Author
Tang, Huaxing ; Chen, Gang ; Reddy, Sudhakar M. ; Wang, Chen ; Rajski, Janusz ; Pomeranz, Irith
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
fYear
2005
fDate
7-11 March 2005
Firstpage
450
Abstract
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns increase the ability to detect unmodeled defects. The proposed method can be used with any test generation procedure to improve the effectiveness of the tests in detecting unmodeled defects. Experimental results on several industrial designs show the effectiveness of defect aware tests. We also propose a measure to estimate the effectiveness of given test sets in detecting unmodeled defects.
Keywords
automatic test pattern generation; integrated circuit testing; semiconductor device testing; VLSI circuits; defect aware ATPG; defect aware test pattern generation; test generation procedure; unmodeled defects; Automatic testing; Design automation; Europe;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2005. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2288-2
Type
conf
DOI
10.1109/DATE.2005.110
Filename
1395603
Link To Document