Title :
Defect aware test patterns
Author :
Tang, Huaxing ; Chen, Gang ; Reddy, Sudhakar M. ; Wang, Chen ; Rajski, Janusz ; Pomeranz, Irith
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Abstract :
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns increase the ability to detect unmodeled defects. The proposed method can be used with any test generation procedure to improve the effectiveness of the tests in detecting unmodeled defects. Experimental results on several industrial designs show the effectiveness of defect aware tests. We also propose a measure to estimate the effectiveness of given test sets in detecting unmodeled defects.
Keywords :
automatic test pattern generation; integrated circuit testing; semiconductor device testing; VLSI circuits; defect aware ATPG; defect aware test pattern generation; test generation procedure; unmodeled defects; Automatic testing; Design automation; Europe;
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Print_ISBN :
0-7695-2288-2
DOI :
10.1109/DATE.2005.110