• DocumentCode
    2588463
  • Title

    A Pattern-driven Development Process for Quality Standard-conforming Business Process Models

  • Author

    Förster, Alexander ; Engels, Gregor ; Schattkowsky, Tim ; Van Der Straeten, Ragnhild

  • Author_Institution
    Paderborn Univ.
  • fYear
    2006
  • fDate
    4-8 Sept. 2006
  • Firstpage
    135
  • Lastpage
    142
  • Abstract
    Quality management is a hot issue in most organisations and must be considered in the business processes of the organisation. Existing approaches on business process modelling provide neither explicit strategy to model quality requirements on business processes nor do they provide explicit support for the construction of business processes satisfying such quality requirements. In this paper, we present a pattern-driven development process for modelling business processes with respect to given quality constraints. We introduce a visual pattern specification language based on UML Activity Diagrams that enables the expression of quality constraints as patterns. These patterns can be used in a forward-engineering development process which supports the business process designer in constructing business processes by applying patterns. Thereby, quality constraints can be integrated into the design of business processes seamlessly
  • Keywords
    corporate modelling; object-oriented programming; quality management; specification languages; visual languages; UML Activity Diagrams; business process modelling; forward-engineering development; pattern-driven development process; quality management; visual pattern specification language; Contracts; Domain specific languages; Humans; ISO standards; Natural languages; Process design; Quality management; Specification languages; Total quality management; Unified modeling language; Business process modelling; development; patternbased; visual domain specific language;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Visual Languages and Human-Centric Computing, 2006. VL/HCC 2006. IEEE Symposium on
  • Conference_Location
    Brighton
  • Print_ISBN
    0-7695-2586-5
  • Type

    conf

  • DOI
    10.1109/VLHCC.2006.5
  • Filename
    1698775