DocumentCode :
2588819
Title :
Low power oriented CMOS circuit optimization protocol
Author :
Verle, A. ; Michel, X. ; Azemard, N. ; Maurine, P. ; Auvergne, D.
Author_Institution :
LIRMM, Univ. Montpellier II, France
fYear :
2005
fDate :
7-11 March 2005
Firstpage :
640
Abstract :
Low power oriented circuit optimization consists in selecting the best alternative between gate sizing, buffer insertion and logic structure transformation, for satisfying a delay constraint at minimum area cost. In this paper, we used a closed form model of delay in CMOS structures to define metrics for a deterministic selection of the optimization alternative. The target is delay constraint satisfaction with minimum area cost. We validate the design space exploration method, defining maximum and minimum delay bounds on logical paths. Then we adapt this method to a "constant sensitivity method" allowing us to size a circuit at minimum area under a delay constraint. An optimisation protocol is finally defined to manage the performance constraint/circuit structure trade-off. These methods are implemented in an optimization tool (POPS) and validated by comparing, on a 0.25 μm process, the optimization efficiency obtained on various benchmarks (ISCAS\´85) to that resulting from an industrial tool.
Keywords :
CMOS logic circuits; circuit optimisation; integrated circuit design; logic design; low-power electronics; 0.25 micron; CMOS structure delay model; POPS; area cost minimization; buffer insertion; circuit path optimization protocol; constant sensitivity method; delay constraints; design space exploration method; gate sizing; logic structure transformation; logical path delay bounds; low power oriented CMOS; optimization efficiency; optimization tool; performance constraint/circuit structure trade-off; CMOS logic circuits; Circuit optimization; Cost function; Delay; Design methodology; Logic circuits; Optimization methods; Protocols; Semiconductor device modeling; Space exploration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2288-2
Type :
conf
DOI :
10.1109/DATE.2005.202
Filename :
1395641
Link To Document :
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