DocumentCode :
2589538
Title :
New international standards on reliability growth
Author :
Crow, Larry H.
Author_Institution :
AT&T Bell Lab., Whippany, NJ, USA
fYear :
1991
fDate :
29-31 Jan 1991
Firstpage :
478
Lastpage :
480
Abstract :
A review is presented of two international standards on reliability growth developed by the International Electrotechnical Commission (IEC) for world trade. The first IEC standard discussed is IEC 1014, Programmes for Reliability Growth, and the second IEC standard discussed is IEC 56 (Central Office) 150 Reliability Growth Models and Estimation Methods. IEC 1014 was issued as an international standard in 1989 and IEC56 (Central Office) 150 is an approved Draft International Standard. These standards cover the management and modeling aspects, respectively, of a reliability growth program. An overview of these documents is given, together with a more detailed discussion of various reliability growth terminology, procedures, and models presented in these international standards
Keywords :
reliability; standards; IEC 1014; IEC 56; International Electrotechnical Commission; international standards; reliability growth; Guidelines; IEC standards; Power system modeling; Power system reliability; Reliability engineering; Software standards; Standards development; Standards publication; System testing; Terminology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1991. Proceedings., Annual
Conference_Location :
Orlando, FL
Print_ISBN :
0-87942-661-6
Type :
conf
DOI :
10.1109/ARMS.1991.154483
Filename :
154483
Link To Document :
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