DocumentCode :
2589700
Title :
FORAY-GEN: automatic generation of affine functions for memory optimizations
Author :
Issenin, Ilya ; Dutt, Nikil
Author_Institution :
Donald Bren Sch. of Inf. & Comput. Sci., California Univ., Irvine, CA, USA
fYear :
2005
fDate :
7-11 March 2005
Firstpage :
808
Abstract :
In today´s embedded applications, a significant portion of energy is spent in the memory subsystem. Several approaches have been proposed to minimize this energy, including the use of scratch pad memories, with many based on static analysis of a program. However, it is often not possible to perform static analysis and optimization of a program´s memory access behavior unless the program is specifically written for this purpose. We introduce the FORAY model of a program that permits aggressive analysis of the application´s memory behavior that further enables such optimization since it consists of ´for´ loops and array accesses which are easily analyzable. We present FORAY-GEN, an automated profile-based approach for extraction of the FORAY model from the original program. We also demonstrate how FORAY-GEN enhances applicability of other memory subsystem optimization approaches, resulting in an average doubling in the number of memory references that can be analyzed by existing static approaches.
Keywords :
embedded systems; optimisation; storage management; array accesses; automatic affine function generation; embedded applications; for loops; memory behavior; memory optimization; memory references; scratch pad memories; static program analysis; Application software; Delay; Embedded computing; Energy consumption; Performance analysis; Scanning probe microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2288-2
Type :
conf
DOI :
10.1109/DATE.2005.157
Filename :
1395678
Link To Document :
بازگشت