DocumentCode :
2589725
Title :
Reliability and the Physics of Failure Program at RADC
Author :
Vaccaro, Joseph
fYear :
1962
fDate :
Sept. 1962
Firstpage :
4
Lastpage :
10
Keywords :
Aerospace electronics; Command and control systems; Design engineering; Electronic equipment; Force control; Land surface temperature; Missiles; Physics; Reliability engineering; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location :
Chicago, IL, USA
ISSN :
0097-2088
Type :
conf
DOI :
10.1109/IRPS.1962.359979
Filename :
4201985
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2589725
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