Title :
Anomalous Radiation Damage Effect on Capacitance of Si Diodes
Author :
Babcock, R.V. ; Malinaric, P.J.
Author_Institution :
Westinghouse Electric Corporation, Research and Development Laboratories, Radiation and Nucleonics Laboratory, Pittsburgh, Pennsylvania
Keywords :
Capacitance; Conductivity; Electrons; Laboratories; Neutrons; Nuclear electronics; Predictive models; Radiation detectors; Radiation effects; Semiconductor diodes;
Conference_Titel :
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1962.359983
