Title :
Project Control to Provide for the Physics of Failure in Electronics
Author :
Ryerson, Clifford M.
Author_Institution :
Division Manager, Pan Technical Systems, Inc., Montrose, California
Keywords :
Circuits; Control systems; Defense industry; Design engineering; Heart; Physics; Project management; Reliability engineering; Resistors; Testing;
Conference_Titel :
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1962.359984
