Title : 
Fundamental Failure Mechanism Studies
         
        
            Author : 
Phillips, R.G. ; Anderson, G.P. ; Erickson, R.A.
         
        
            Author_Institution : 
Univac Division of Sperry Rand Corporation, St. Paul, Minnesota
         
        
        
        
        
        
            Keywords : 
Application software; Failure analysis; Large-scale systems; Manufacturing processes; Materials reliability; Military computing; Protection; Quality control; Solid state circuits; Testing;
         
        
        
        
            Conference_Titel : 
Physics of Failure in Electronics, 1962. First Annual Symposium on the
         
        
            Conference_Location : 
Chicago, IL, USA
         
        
        
        
            DOI : 
10.1109/IRPS.1962.359985