Title :
Fundamental Failure Mechanism Studies
Author :
Phillips, R.G. ; Anderson, G.P. ; Erickson, R.A.
Author_Institution :
Univac Division of Sperry Rand Corporation, St. Paul, Minnesota
Keywords :
Application software; Failure analysis; Large-scale systems; Manufacturing processes; Materials reliability; Military computing; Protection; Quality control; Solid state circuits; Testing;
Conference_Titel :
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1962.359985