Title :
Concept of Near-Field Millimeter-Wave Imaging System with a Spatial Resolution beyond the Abbe Barrier
Author :
Minin, I.V. ; Minin, O.V.
Author_Institution :
Novosibirsk State Tech. Univ., Novosibirsk
Abstract :
A near-field millimeter-wave (mm-wave) imaging system with a spatial resolution of less than 0.5 lambda has been designed in the millimeter wave range for on-line inspection of nonmetallic (dielectric) materials. The imaging system consists of a transceiver block coupled to an antenna that scans the material to be imaged; a reflector plate is placed behind the material. As an antenna a diffractive optics with focus F < lambda is used. Such an antenna allow to focusing of millimeter-wave radiation beyond the Abbe barrier. A quadrature IF mixer in the transceiver block enables measurement of in-phase and quadrature-phase components of reflected signals with respect to the transmitted signal. The initial results show the feasibility of the near-field mm-wave sensor for nondestructive inspection of materials with sub-Rayleigh resolution. Using future optically dense modified Fresnel lenses, a resolution of the order lambda/100 seems to become possible.
Keywords :
antenna radiation patterns; dielectric materials; diffractive optical elements; image resolution; millimetre wave antennas; millimetre wave imaging; nondestructive testing; Abbe barrier; diffractive optics; in-phase component; millimeter-wave radiation; mm-wave imaging system; near-field millimeter-wave imaging system; near-field mm-wave sensor; nondestructive inspection; nonmetallic dielectric material; on-line inspection; optically dense modified Fresnel lenses; quadrature IF mixer; quadrature-phase component; reflector plate; spatial resolution; sub-Rayleigh resolution; transceiver block; Dielectric materials; Focusing; Inspection; Optical imaging; Optical materials; Optical sensors; Reflector antennas; Signal resolution; Spatial resolution; Transceivers; Abbe barrier; Fresnel lens; millimeter wave imaging system; nondestructive testing; sub-Rayleigh resolution;
Conference_Titel :
Microwave Conference, 2008 China-Japan Joint
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3821-1
DOI :
10.1109/CJMW.2008.4772481