Title :
Precise Measurement of Low Loss Dielectric Materials Using Quasi-optical cavity Technique
Author :
Zhang, Juan ; Li, Guohui ; Xu, Deming
Author_Institution :
Sch. of Commun. & Inf. Eng, Shanghai Univ., Shanghai
Abstract :
The method of Fabry-Perot quasi-optical cavity is one of the most accurate methods for the precision measurements of complex permittivity and loss tangent of low loss dielectric materials at millimeter wave frequencies. In our earlier work, a fixed operation frequency is employed for the cavity length variation technique. In recent years, with the increasingly high-precision request and the instrumentation progress in both hardware and software, the frequency variation technique has become commonly used in quasi-optical cavity system. In this paper, we describe some considerations in quasi-optical resonator test system designation, together with mode identity techniques and the measurement results of some materials.
Keywords :
Fabry-Perot resonators; cavity resonators; dielectric materials; microwave materials; millimetre wave devices; permittivity; Fabry-Perot cavity; cavity length variation technique; complex permittivity; dielectric measurement; low loss dielectric materials; millimeter wave frequency; quasioptical cavity technique; quasioptical resonator; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Fabry-Perot; Frequency measurement; Instruments; Loss measurement; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; dielectric measurement; frequency swept; quasi-optical cavity;
Conference_Titel :
Microwave Conference, 2008 China-Japan Joint
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3821-1
DOI :
10.1109/CJMW.2008.4772487