DocumentCode :
2590017
Title :
Reliability Physics (The Physics of Failure)
Author :
Earles, Donald R. ; Eddins, Mary F.
Author_Institution :
Chief, Reliability Analysis Section
fYear :
1962
fDate :
Sept. 1962
Firstpage :
179
Lastpage :
193
Keywords :
Assembly; Circuit topology; Design engineering; Failure analysis; Frequency; Mathematics; Physics; Reliability engineering; Stress; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location :
Chicago, IL, USA
ISSN :
0097-2088
Type :
conf
DOI :
10.1109/IRPS.1962.359994
Filename :
4202000
Link To Document :
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