Title :
Reliability Physics (The Physics of Failure)
Author :
Earles, Donald R. ; Eddins, Mary F.
Author_Institution :
Chief, Reliability Analysis Section
Keywords :
Assembly; Circuit topology; Design engineering; Failure analysis; Frequency; Mathematics; Physics; Reliability engineering; Stress; Uncertainty;
Conference_Titel :
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1962.359994