DocumentCode
2590028
Title
Thermal Instabilities and Hot Spots in Junction Transistors
Author
Scarlett, R.M. ; Shockley, W. ; Haitz, R.H.
Author_Institution
Shockley Transistor, Unit of Clevite Transistor, Palo Alto, California
fYear
1962
fDate
Sept. 1962
Firstpage
194
Lastpage
203
Keywords
Alloying; Current density; Current distribution; Electric breakdown; Heat sinks; Power transistors; Silicon; Temperature dependence; Temperature distribution; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location
Chicago, IL, USA
ISSN
0097-2088
Type
conf
DOI
10.1109/IRPS.1962.359995
Filename
4202001
Link To Document