مرکز منطقه ای اطلاع رساني علوم و فناوري - Current Noise Measurement as a Failure Analysis Tool for Film Resistors

DocumentCode :

2590035

Title :

Current Noise Measurement as a Failure Analysis Tool for Film Resistors

Author :

Curtis, J.G.

Author_Institution :

Senior Applications Engineer, Corning Electronic Components, Corning Glass Works

fYear :

1962

fDate :

Sept. 1962

Firstpage :

204

Lastpage :

213

Keywords :

Current measurement; Failure analysis; Frequency; Geometry; Glass; Noise level; Noise measurement; Resistors; Thermal resistance; Voltage;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Physics of Failure in Electronics, 1962. First Annual Symposium on the

Conference_Location :

Chicago, IL, USA

ISSN :

0097-2088

Type :

conf

DOI :

10.1109/IRPS.1962.359996

Filename :

4202002

Link To Document :