DocumentCode

2590035

Title

Current Noise Measurement as a Failure Analysis Tool for Film Resistors

Author

Curtis, J.G.

Author_Institution

Senior Applications Engineer, Corning Electronic Components, Corning Glass Works

fYear

1962

fDate

Sept. 1962

Firstpage

204

Lastpage

213

Keywords

Current measurement; Failure analysis; Frequency; Geometry; Glass; Noise level; Noise measurement; Resistors; Thermal resistance; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1962. First Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

conf

DOI

10.1109/IRPS.1962.359996

Filename

4202002