Title :
Some Aspects of Dielectric Degradation in Perovskites
Author :
Gerson, Robert ; Berlincourt, Don
Author_Institution :
Electronic Research Division, Clevite Corporation; University of Missouri School of Mines and Metallurgy, Rolla, Mo.
Keywords :
Ceramics; Conductivity; Degradation; Dielectric breakdown; Dielectric materials; Ferroelectric materials; High-K gate dielectrics; Lead; Stress; Temperature;
Conference_Titel :
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1962.359998
