DocumentCode :
2590091
Title :
Electrical Detection of Surface Effects in Transistors
Author :
Card, W.Howard
Author_Institution :
Syracuse University
fYear :
1962
fDate :
Sept. 1962
Firstpage :
231
Lastpage :
245
Keywords :
Degradation; Electric variables measurement; Electrical resistance measurement; Failure analysis; Germanium alloys; Noise measurement; Pollution measurement; Semiconductor device noise; Surface contamination; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location :
Chicago, IL, USA
ISSN :
0097-2088
Type :
conf
DOI :
10.1109/IRPS.1962.359999
Filename :
4202005
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2590091
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