Title :
AlGaN/GaN HEMTs on SiC: towards power operation at V-band
Author :
Quay, R. ; Tessmann, A. ; Kiefer, R. ; Weber, R. ; van Raay, F. ; Kuri, M. ; Riessle, M. ; Massler, H. ; Muller, S. ; Schlechtweg, M. ; Weimann, G.
Author_Institution :
Fraunhofer-Inst. of Appl. Solid-State Phys., Freiburg, Germany
Abstract :
The operation of AlGaN/GaN HEMTs on SiC substrate at V-band frequencies (50-75 GHz) is discussed. Both common source and dual-gate AlGaN/GaN HEMTs on SiC substrate are optimized and investigated by active and passive load-pull measurements. At 60 GHz, a power density of /spl ges/0.5 W/mm can be measured for a small common source AlGaN/GaN HEMT limited so far by the available input power of the newly developed load-pull system. A common source HEMT with W/sub g/=0.18 mm yields a power density of 1.9 W/mm at 40 GHz and a linear power gain of /spl ges/5 dB at 60 GHz, while several dual-gate AlGaN/GaN HEMTs of W/sub g/=0.18 mm and 0.36 mm yield MSG/MAG values /spl ges/12 dB at 60 GHz.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; millimetre wave field effect transistors; semiconductor device measurement; 0.18 mm; 0.36 mm; 40 GHz; 5 dB; 50 to 75 GHz; 60 GHz; AlGaN-GaN; AlGaN/GaN HEMT; SiC; SiC substrate; V-band power operation; active load-pull measurements; common source AlGaN/GaN HEMT; dual-gate AlGaN/GaN HEMT; input power; linear power gain; load-pull system; passive load-pull measurements; power density; Aluminum gallium nitride; Frequency; Gallium arsenide; Gallium nitride; HEMTs; MODFETs; PHEMTs; Power generation; Silicon carbide; Solid state circuits;
Conference_Titel :
Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-7872-5
DOI :
10.1109/IEDM.2003.1269346