Title :
Buffer insertion considering process variation
Author :
Xiong, Jinjun ; Tam, Kingho ; He, Lei
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
A comprehensive probabilistic methodology is proposed to solve the buffer insertion problem with the consideration of process variations. In contrast to a recent work, we point out, for the first time, that the correlation between the required arrival time and the downstream loading capacitance must be considered in order to solve the problem "correctly". We develop an efficient bottom-up recursive algorithm to calculate the joint probability density function that accurately captures the above correlation, and propose effective pruning rules to exclude probabilistically inferior solutions. We verify our buffer insertion using timing analysis with both device and interconnect variations, and show that compared to the conventional buffer insertion algorithm using nominal device and interconnect parameters, our new buffer insertion methodology can reduce the probability of timing violation by up to 30%.
Keywords :
buffer circuits; capacitance; integrated circuit design; integrated circuit interconnections; integrated circuit manufacture; network routing; probability; timing; bottom-up recursive algorithm; buffer insertion; correlation; device variations; downstream loading capacitance; interconnect parameters; interconnect variations; joint probability density function; probabilistic methodology; process variation; pruning rules; required arrival time; timing analysis; timing violation probability; Building integrated photovoltaics; Capacitance; Distributed computing; Integrated circuit interconnections; Law; Legal factors; Probability density function; Routing; Timing; Wire;
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Print_ISBN :
0-7695-2288-2
DOI :
10.1109/DATE.2005.85