• DocumentCode
    2590874
  • Title

    The influence of electrode´s stratified structures on SAW devices microwave characteristics

  • Author

    Suchkov, Sergey ; Suchkov, Dmitry ; Chaikovskiy, Dmitry

  • Author_Institution
    Phys. Dept., Saratov State Univ., Saratov, Russia
  • fYear
    2009
  • fDate
    20-24 April 2009
  • Firstpage
    443
  • Lastpage
    445
  • Abstract
    The thickness and elastic properties of electrodes´ aluminum film as well as behavior nanometer adhesion sublayer influence on characteristics of SAW devices in microwave band. Influence adhesion sublayer thickness to thermostability resonance frequency of IDT on ST-cuts quartz at the 2 GHz and also reflection coefficient SAW from electrodes´ edges IDT is investigated. Determine value layer thickness of aluminum and also values adhesion sublayer thickness of chrome and vanadium into two-layer electrodes at which the reflection coefficient is equal to the zero. In paper is shown substantial influence adhesion sublayer on frequency description amplitude-frequency characteristic of SAW filter. Into the there are some crystallography directions in the crystal LiNbO3 found strong frequency dependence angle between group and phase velocities. Some crystallography crystal cuts and directions in the crystal LiNbO3 with layer structure Ltmetal film-piezocrystalGt on the surface are found at which exists strong frequency dependence of angle between group and phase velocities.
  • Keywords
    adhesion; crystallography; elasticity; electrodes; lithium compounds; quartz; surface acoustic wave filters; IDT; SAW devices microwave characteristics; SAW filter; ST-cuts quartz; adhesion sublayer thickness; aluminum film; behavior nanometer adhesion sublayer; chrome; crystallography crystal; crystallography directions; elastic property; electrode stratified structures; frequency dependence angle; frequency description amplitude-frequency characteristic; microwave band; phase velocity; reflection coefficient; thermostability resonance frequency; value layer thickness; vanadium; Adhesives; Aluminum; Crystallography; Electrodes; Frequency dependence; Microwave devices; Nanoscale devices; Optical films; Reflection; Surface acoustic wave devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 2009 Joint with the 22nd European Frequency and Time forum. IEEE International
  • Conference_Location
    Besancon
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-4244-3511-1
  • Electronic_ISBN
    1075-6787
  • Type

    conf

  • DOI
    10.1109/FREQ.2009.5168218
  • Filename
    5168218