DocumentCode
2590874
Title
The influence of electrode´s stratified structures on SAW devices microwave characteristics
Author
Suchkov, Sergey ; Suchkov, Dmitry ; Chaikovskiy, Dmitry
Author_Institution
Phys. Dept., Saratov State Univ., Saratov, Russia
fYear
2009
fDate
20-24 April 2009
Firstpage
443
Lastpage
445
Abstract
The thickness and elastic properties of electrodes´ aluminum film as well as behavior nanometer adhesion sublayer influence on characteristics of SAW devices in microwave band. Influence adhesion sublayer thickness to thermostability resonance frequency of IDT on ST-cuts quartz at the 2 GHz and also reflection coefficient SAW from electrodes´ edges IDT is investigated. Determine value layer thickness of aluminum and also values adhesion sublayer thickness of chrome and vanadium into two-layer electrodes at which the reflection coefficient is equal to the zero. In paper is shown substantial influence adhesion sublayer on frequency description amplitude-frequency characteristic of SAW filter. Into the there are some crystallography directions in the crystal LiNbO3 found strong frequency dependence angle between group and phase velocities. Some crystallography crystal cuts and directions in the crystal LiNbO3 with layer structure Ltmetal film-piezocrystalGt on the surface are found at which exists strong frequency dependence of angle between group and phase velocities.
Keywords
adhesion; crystallography; elasticity; electrodes; lithium compounds; quartz; surface acoustic wave filters; IDT; SAW devices microwave characteristics; SAW filter; ST-cuts quartz; adhesion sublayer thickness; aluminum film; behavior nanometer adhesion sublayer; chrome; crystallography crystal; crystallography directions; elastic property; electrode stratified structures; frequency dependence angle; frequency description amplitude-frequency characteristic; microwave band; phase velocity; reflection coefficient; thermostability resonance frequency; value layer thickness; vanadium; Adhesives; Aluminum; Crystallography; Electrodes; Frequency dependence; Microwave devices; Nanoscale devices; Optical films; Reflection; Surface acoustic wave devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 2009 Joint with the 22nd European Frequency and Time forum. IEEE International
Conference_Location
Besancon
ISSN
1075-6787
Print_ISBN
978-1-4244-3511-1
Electronic_ISBN
1075-6787
Type
conf
DOI
10.1109/FREQ.2009.5168218
Filename
5168218
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