Title :
VLSI manufacturing in Japan and the United States
Author :
Hodges, David A.
Author_Institution :
Coll. of Eng., California Univ., Berkeley, CA, USA
Abstract :
Very-large-scale integration (VLSI) manufacturing techniques in Japan are compared with those in the United States. Factory design, employment practices, random vs. causal yield fluctuations, process control and productivity, and computer integrated manufacturing (CIM) systems are discussed
Keywords :
CAD/CAM; VLSI; integrated circuit manufacture; manufacturing computer control; manufacturing data processing; CIM systems; Japan; United States; VLSI manufacturing; computer integrated manufacturing; employment practices; factory design; process control; productivity; yield fluctuations; Assembly; Fabrication; Incentive schemes; Manufacturing automation; Process control; Production facilities; Productivity; Semiconductor device manufacture; Testing; Very large scale integration;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1990. ASMC 90 Proceedings. IEEE/SEMI 1990
Conference_Location :
Danvers, MA
DOI :
10.1109/ASMC.1990.111211
