DocumentCode :
2591203
Title :
Single crystal SiC capacitive pressure sensor at 400/spl deg/C
Author :
Jiangang Du ; Young, D.J. ; Zorman, C.A. ; Ko, W.H.
Author_Institution :
EECS Dept., Case Western Reserve Univ., Cleveland, OH, USA
fYear :
2003
fDate :
8-10 Dec. 2003
Abstract :
Single crystal 3C-SiC capacitive pressure sensors are proposed for high-temperature sensing applications. The prototype device consists of an edge-clamped circular SiC diaphragm with a radius of 400 /spl mu/m and a thickness of 0.5 /spl mu/m suspended over a 2 /spl mu/m sealed cavity on a silicon substrate. The fabricated sensor demonstrates a high-temperature sensing capability up to 400/spl deg/C, limited by the test setup. At 400/spl deg/C, the device achieves a linear characteristic response between 1100 torr and 1760 torr with a sensitivity of 7.7 ff/torr, a linearity of 2.1%, a hysterisis of 3.7%, and a sensing resolution of 9.1 torr (12 mbar).
Keywords :
capacitive sensors; diaphragms; pressure sensors; silicon compounds; wide band gap semiconductors; 0.5 micron; 1100 to 1760 torr; 2 micron; 400 degC; 400 micron; SiC; edge-clamped circular diaphragm; high-temperature pressure sensors; linear characteristic response; sealed cavity; sensing resolution; silicon substrate; single crystal 3C-SiC capacitive pressure sensors; Capacitance; Capacitive sensors; Chemical sensors; Mechanical sensors; Prototypes; Sensor phenomena and characterization; Silicon carbide; Substrates; Temperature dependence; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-7872-5
Type :
conf
DOI :
10.1109/IEDM.2003.1269397
Filename :
1269397
Link To Document :
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