DocumentCode :
2591241
Title :
Verification of embedded memory systems using efficient memory modeling
Author :
Ganai, Malay K. ; Gupta, Aarti ; Ashar, Pranav
Author_Institution :
NEC Labs. America, Princeton, NJ, USA
fYear :
2005
fDate :
7-11 March 2005
Firstpage :
1096
Abstract :
We describe verification techniques for embedded memory systems using efficient memory modeling (EMM), without explicitly modeling each memory bit. We extend our previously proposed approach of EMM in bounded model checking (BMC) for a single read/write port single memory system, to more commonly occurring systems with multiple memories, having multiple read and write ports. More importantly, we augment such EMM to providing correctness proofs, in addition to finding real bugs as before. The novelties of our verification approach are in (a) combining EMM with a proof-based abstraction that preserves the correctness of a property up to a certain analysis depth of SAT-based BMC, and (b) modeling arbitrary initial memory state precisely and thereby providing inductive proofs using SAT-based BMC for embedded memory systems. Similar to the previous approach, we construct a verification model by eliminating memory arrays, but retaining the memory interface signals with their control logic and adding constraints on those signals at every analysis depth to preserve the data forwarding semantics. The size of these EMM constraints depends quadratically on the number of memory accesses and the number of read and write ports; and linearly on the address and data widths and the number of memories. We show the effectiveness of our approach on several industry designs and software programs.
Keywords :
embedded systems; formal verification; integrated circuit design; integrated circuit modelling; logic design; semiconductor storage; system-on-chip; SoC; bounded model checking; control logic; correctness proofs; efficient memory modeling; embedded memory system verification; formal verification; inductive proofs; industry designs; multiple memories; multiple read ports; multiple write ports; software programs; Computer bugs; Computer industry; Concrete; Explosions; Laboratories; Logic arrays; National electric code; Read-write memory; Refining; Signal analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2288-2
Type :
conf
DOI :
10.1109/DATE.2005.325
Filename :
1395739
Link To Document :
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