DocumentCode :
259169
Title :
Stochastic verification of run-time performance adaptation with field delay testing
Author :
Hashimoto, Masanori
Author_Institution :
Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
fYear :
2014
fDate :
17-20 Nov. 2014
Firstpage :
751
Lastpage :
754
Abstract :
Run-time performance adaptation with field delay testing is a promising approach for minimizing design margin while sustaining necessary operational margin in the field. However, run-time performance adaptation has not been adopted in industrial designs since a serious concern on timing error occurrence exists. For putting the run-time performance adaptation in a practical use, we need to verify and optimize the run-time adaptation system in design time. For this purpose, we have developed a stochastic framework for error rate estimation that models adaptive speed control as a continuous-time Markov process. In this paper, we evaluate MTTF and power consumption of an embedded processor whose performance is adaptively controlled with online testing and offline testing. This evaluation quantitatively shows the power reduction and MTTF improvement thanks to run-time performance adaptation.
Keywords :
Markov processes; integrated circuit design; integrated circuit testing; MTTF; adaptive speed control; continuous-time Markov process; design margin; embedded processor; error rate estimation; field delay testing; run-time performance adaptation; stochastic verification; Delays; Error analysis; Monitoring; Power dissipation; Velocity control; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (APCCAS), 2014 IEEE Asia Pacific Conference on
Conference_Location :
Ishigaki
Type :
conf
DOI :
10.1109/APCCAS.2014.7032890
Filename :
7032890
Link To Document :
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