Title :
A new generation of digital VLSI CAD tools based on probability
Author :
Abdallah, Nizar ; Dunoyer, Julien ; Sabet, Pirouz Bazargan
Author_Institution :
Lab. MASI, Univ. Pierre et Marie Curie, Paris, France
Abstract :
This paper discloses the importance of the probabilistic approach in a wide variety of CAD tools specially when dealing with large digital designs. It explains when and how to use probability efficiently by computing useful information´s on internal signals out of probabilistic information´s on the inputs of the circuit. Drawbacks of such approach, such as the signal´s correlation problem, are also presented with solutions to some of them based on symbolic simulation and binary decision diagram (BDD) manipulation
Keywords :
VLSI; circuit CAD; circuit analysis computing; digital integrated circuits; probability; binary decision diagram; correlation problem; digital VLSI CAD tools; internal signals; probabilistic approach; probabilistic information; symbolic simulation; Board of Directors; Boolean functions; Circuit simulation; Circuit testing; Computational modeling; Data structures; Energy consumption; Logic; Steady-state; Very large scale integration;
Conference_Titel :
System Theory, 1995., Proceedings of the Twenty-Seventh Southeastern Symposium on
Conference_Location :
Starkville, MS
Print_ISBN :
0-8186-6985-3
DOI :
10.1109/SSST.1995.390525
