Title :
On the optimal design of triple modular redundancy logic for SRAM-based FPGAs
Author :
Kastensmidt, F. Lima ; Sterpone, L. ; Carro, L. ; Reorda, M. Sonza
Author_Institution :
Engenharia em Sistemas Digitais, Univ. Estadual do Rio Grande do Sul (UERGS), Guaiba, Brazil
Abstract :
Triple modular redundancy (TMR) is a suitable fault tolerant technique for SRAM-based FPGA. However, one of the main challenges in achieving 100% robustness in designs protected by TMR running on programmable platforms is to prevent upsets in the routing from provoking undesirable connections between signals from distinct redundant logic parts, which can generate an error in the output. This paper investigates the optimal design of the TMR logic (e.g., by cleverly inserting voters) to ensure robustness. Four different versions of a TMR digital filter were analyzed by fault injection. Faults were randomly inserted straight into the bitstream of the FPGA. The experimental results presented in this paper demonstrate that the number and placement of voters in the TMR design can directly affect the fault tolerance, ranging from 4.03% to 0.98% the number of upsets in the routing able to cause an error in the TMR circuit.
Keywords :
SRAM chips; circuit optimisation; digital filters; digital signal processing chips; fault tolerance; field programmable gate arrays; logic design; network routing; redundancy; FPGA; SRAM; TMR digital filter; TMR logic; circuit routing; fault injection; fault tolerance; fault tolerant technique; optimal design; triple modular redundancy logic; voter insertion; Circuit faults; Fault tolerance; Field programmable gate arrays; Logic design; Protection; Redundancy; Robustness; Routing; Signal design; Signal generators;
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Print_ISBN :
0-7695-2288-2
DOI :
10.1109/DATE.2005.229