DocumentCode
2592573
Title
MEMS viscosity sensor
Author
Ballato, Arthur
Author_Institution
US Army Commun.-Electron. RDEC, Fort Monmouth, NJ, USA
fYear
2009
fDate
20-24 April 2009
Firstpage
784
Lastpage
787
Abstract
Quartz shear resonators are employed widely as sensors to measure Newtonian viscosities of liquids. Perturbation of the electrical equivalent circuit parameters of the plate resonator by the fluid loading permits calculation of the mass density-shear viscosity product. Use of doubly rotated resonators does permit additional information to be obtained, but in no case can the viscosity and mass density values be separated. In these measurements, the resonator surface is exposed to a measurand bath whose extent greatly exceeds the penetration depth of the evanescent shear mode excited by the active element. Here we discuss the more complicated situation where the separation between the resonator and a confining wall is less than the penetration depth of the fluid occupying the intervening region. The resonator perturbation in this case is a sensitive function of the separation. This important fact permits extreme miniaturization, since for temperatures and pressures ordinarily encountered with gases and liquids, and for frequencies between 10 MHz and 1 GHz, the penetration depth varies from micrometers to nanometers. Micro-electro-mechanical (MEMS) versions of viscometers and associated types of fluid sensors are thereby enabled.
Keywords
equivalent circuits; micromechanical devices; viscosity measurement; MEMS viscosity sensor; Newtonian viscosity measurement; electrical equivalent circuit parameters; evanescent shear mode; mass density; microelectromechanical versions; quartz shear resonators; resonator perturbation; shear viscosity; Equivalent circuits; Frequency measurement; Gases; Liquids; Micromechanical devices; Solids; Surface impedance; Surface treatment; Temperature sensors; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 2009 Joint with the 22nd European Frequency and Time forum. IEEE International
Conference_Location
Besancon
ISSN
1075-6787
Print_ISBN
978-1-4244-3511-1
Electronic_ISBN
1075-6787
Type
conf
DOI
10.1109/FREQ.2009.5168292
Filename
5168292
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