• DocumentCode
    2593158
  • Title

    Test cost/coverage tradeoffs in complex telecommunication circuits

  • Author

    Aguado, M.J.

  • fYear
    1994
  • fDate
    30 Jun-1 Jul 1994
  • Keywords
    Application specific integrated circuits; Automatic testing; Cats; Central Processing Unit; Circuit faults; Circuit testing; Costs; Design for testability; Prototypes; Telecommunications;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop, 1994. ATW '94. The Third Annual Atlantic
  • Type

    conf

  • DOI
    10.1109/ATW.1994.747830
  • Filename
    747830
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2593158