Title :
Test cost/coverage tradeoffs in complex telecommunication circuits
fDate :
30 Jun-1 Jul 1994
Keywords :
Application specific integrated circuits; Automatic testing; Cats; Central Processing Unit; Circuit faults; Circuit testing; Costs; Design for testability; Prototypes; Telecommunications;
Conference_Titel :
Test Workshop, 1994. ATW '94. The Third Annual Atlantic
DOI :
10.1109/ATW.1994.747830
