DocumentCode
2593190
Title
Functional Test Generation For finite State Machines With Concurrent Fault Simulation
Author
Cooray, Niranjan I. ; Czeck, Edward W.
Author_Institution
Northeastern University
fYear
1994
fDate
30 Jun-1 Jul 1994
Keywords
Automata; Automatic testing; Circuit faults; Circuit testing; Computational modeling; Computer simulation; Costs; Electrical fault detection; Fault detection; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop, 1994. ATW '94. The Third Annual Atlantic
Type
conf
DOI
10.1109/ATW.1994.747832
Filename
747832
Link To Document