Title :
Near-optimal Test Sequencing Algorithms For Sequential Fault Diagnosisl
Author :
Raghavan, Vijaya ; Pattipati, Krishna R.
Author_Institution :
University of Connecticut
fDate :
30 Jun-1 Jul 1994
Keywords :
Algorithm design and analysis; Cost function; Electronic mail; Fault diagnosis; Heuristic algorithms; Medical tests; Optimized production technology; Power generation economics; Sequential analysis; Testing;
Conference_Titel :
Test Workshop, 1994. ATW '94. The Third Annual Atlantic
DOI :
10.1109/ATW.1994.747834
