Title :
Bayes reliability modeling of a multistate consecutive K-out-of-n: F system
Author :
Haim, M. ; Porat, Z.
Author_Institution :
RAFAEL, Haifa, Israel
Abstract :
A description is given of Bayes reliability modeling of a multistate consecutive K-out-of-n: F system, comprising independent identical multistate units, with Pc , a unit state probabilities vector. The mathematical expression for the conditional system unreliability (CSU) is derived by Markov chain. A Bayesian approach is adopted in order to reflect uncertainty in Pc. It is modeled by a Dirichlet distribution and propagated into CSU. The proposed model provides Bayes prediction tools for the mean values and confidence bounds of the system failure states probabilities
Keywords :
Bayes methods; probability; reliability; Bayes reliability modeling; Dirichlet distribution; Markov chain; comprising independent identical multistate units; conditional system unreliability; multistate consecutive K-out-of-n: F system; system failure states probabilities; uncertainty; unit state probabilities vector; Bayesian methods; Covariance matrix; Maintenance; Predictive models; Probability; Uncertainty; Virtual manufacturing;
Conference_Titel :
Reliability and Maintainability Symposium, 1991. Proceedings., Annual
Conference_Location :
Orlando, FL
Print_ISBN :
0-87942-661-6
DOI :
10.1109/ARMS.1991.154502