Title :
New Testability Measures For High Level Description Of Circuits
Author :
Gentil, M.-H. ; Crestani, D. ; Rhalibi, A.E. ; Durante, C.
fDate :
30 Jun-1 Jul 1994
Keywords :
Area measurement; Circuit analysis; Circuit faults; Circuit testing; Controllability; Information theory; Logic circuits; Logic testing; Observability; Pollution measurement;
Conference_Titel :
Test Workshop, 1994. ATW '94. The Third Annual Atlantic
DOI :
10.1109/ATW.1994.747842
