Title :
The Register Optimization Step In A Self-testing High-level Synthesis Tool.
Author :
Grimal, B. ; Martin, E.
Author_Institution :
University of Rennes
fDate :
30 Jun-1 Jul 1994
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Constraint optimization; Cost function; Fault tolerance; High level synthesis; Optimization methods; Signal processing; Signal synthesis;
Conference_Titel :
Test Workshop, 1994. ATW '94. The Third Annual Atlantic
DOI :
10.1109/ATW.1994.747845
