Title :
Estimating Interval of the Number of Errors for Embedded Software Development Projects
Author :
Iwata, Keiji ; Nakashima, Takayoshi ; Anan, Yoshiyuki ; Ishii, Naohiro
Author_Institution :
Dept. of Bus. Adm., Aichi Univ., Nagoya, Japan
fDate :
Aug. 31 2014-Sept. 4 2014
Abstract :
Previously, we investigated the prediction of total effort and errors for embedded software development projects using an artificial neural network (ANN). In addition, we proposed a method for reducing this margin of error. However, methods using ANNs have reached their improvement limits, since an appropriate value is estimated using what is known as point estimation in statistics. In this paper, we propose a method for predicting the number of errors for embedded software development projects using interval estimation provided by a support vector machine (SVM) and ANN. In our evaluation experiment, we compared the accuracy of the SVM model with that of the ANN model using 10-fold cross-validation. Results of Welch´s t-test show that the SVM model is more accurate.
Keywords :
embedded systems; neural nets; project management; software engineering; statistical testing; support vector machines; 10-fold cross-validation; ANN model; SVM model; Welch´s t-test; artificial neural network; embedded software development projects; error number interval estimation; support vector machine; Accuracy; Artificial neural networks; Data models; Embedded software; Predictive models; Support vector machines; artificial neural network; embedded software development; support vector machine;
Conference_Titel :
Advanced Applied Informatics (IIAIAAI), 2014 IIAI 3rd International Conference on
Conference_Location :
Kitakyushu
Print_ISBN :
978-1-4799-4174-2
DOI :
10.1109/IIAI-AAI.2014.129